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dc.contributor.authorMcNiff MEen_US
dc.contributor.authorRoscigno PFen_US
dc.contributor.authorJi Wen_US
dc.contributor.otheren_US
dc.date.accessioned2010-02-15T17:16:15Z
dc.date.available2010-02-15T17:16:15Z
dc.date.issued1992en_US
dc.identifier.urihttp://hdl.handle.net/1969.3/23323
dc.description405-415en_US
dc.description.abstractA geographic information system (GIS) was used to compile a series of databases containing details concerning metal contamination and pollution sources to study their impacts on the Galveston Bay (TX) ecosystem. Using these databases, a series of maps with various overlays was created with ARC/INFO software. These maps allowed patterns of spatial distribution of numerous variables to be easily visualized so that the impacts of urbanization and industrialization on the natural resources could be examined. Resource managers can use these capabilities in their comprehensive plans for managing individual activities within an overall regulatory framework. The visual displays and cartographic output of the system can be used to locate and identify ecologically sensitive areas and to study trends in these areas over time. These vector GIS techniques have the potential to be more integrated with aerial photography and other remotely sensed data for a more extensive overview of the environment and patterns of interactionen_US
dc.description.urihttp://gbic.tamug.edu/request.htmen_US
dc.publisherPubl by Int Soc for Optical Engineering, Bellingham, WA, USAen_US
dc.relation.ispartofseries50921.00en_US
dc.relation.urien_US
dc.subjectAerial photographyen_US
dc.subjectComputer softwareen_US
dc.subjectContaminationen_US
dc.subjectDatabase systemsen_US
dc.subjectEcosystemsen_US
dc.subjectEnvironmental impacten_US
dc.subjectInformation retrieval systemsen_US
dc.subjectMapsen_US
dc.subjectMarine pollutionen_US
dc.subjectMonitoringen_US
dc.subjectRemote sensingen_US
dc.subjectVisualizationen_US
dc.titleGeographic information systems technique for monitoring contaminants in Galveston Bay, Texasen_US
dc.typeCONFen_US
dc.placeNew Orleans, LA, USAen_US
dc.seriesProceedings of SPIE - The International Society for Optical Engineeringen_US
dc.vol-issue1930(pt 1)en_US
dc.locationen_US
dc.scaleen_US
dc.latitudeen_US
dc.longitudeen_US
dc.contract-noen_US
dc.notesCompilation and indexing terms, Copyright 2004 Elsevier Engineering Information, Incen_US
dc.degreeen_US
dc.acquisition-srcDownloaded from-Engineering Village 2en_US
dc.description-otheren_US
dc.universityen_US
dc.historyen_US
dc.call-noen_US


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